Semiconductor wafer scanning, Flat panel inspection, printed circuit board (PCB) examination, Cell Biology, Astronomy, Medical, Microscopy, Ophthalmology and Retinal imaging, Pathology, Histology, Intelligent Traffic Systems, Fluorescence, Low light, Biometrics, Industrial Automation and others.
Specifications: | |
| Resolution | 9.1 MP 3380 x 2704 pixel |
| Sensor type | CCD B/W |
| Sensor model | SONY ICX814 ALG |
| Sensor size | 16 mm |
| Sensor active area | 12.5 x 10 mm |
| Pixel size | 3.69 µm |
| Bits per pixel | 8, 10, 12, 14 Bits |
| Readout noise typ. | 8.9 / 9.4 / 10.81 e- |
| Dynamic range | 64.7 / 64.5 / 62.8 dB |
| Signal to noise ratio | 43.4 / 43.0 / 42.9 dB |
| Gain range | 37 dB |
| Exposure range | 54us - 1000s |
| Frame rates | 20 Fps |
| On-chip binning | YES |
| Trigger to exposure delay | YES |
| Image data interface | USB 3.0 Superspeed |
| Data I/O | 2IN/2OUT |
| Power requirements | 4.2 Watt |
| Lens mount | C-Mount |
| Weight | 320 grams |
| Dimensions WxHxD | 60 x 60 x 38 mm |
| Customs tariff code | 8525.80 30 (EU) / 8525.80 40 (USA) |
| ECCN | EAR99 |
MR11002MU-BH
|
MC089MG-SY
|
[제이엠제이]
연락처: 010-5251-9748
E-mail: sales@jmjsys.co.kr
